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| موضوع: كتاب Theory and Design for Mechanical Measurements - Sixth Edition الأربعاء 10 مارس 2021, 11:22 pm | |
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أخوانى فى الله أحضرت لكم كتاب Theory and Design for Mechanical Measurements Sixth Edition Richard S. Figliola Clemson University Donald E. Beasley Clemson University
و المحتوى كما يلي :
Contents 1 Basic Concepts of Measurement Methods 1 1.1 Introduction 1 1.2 General Measurement System 2 1.3 Experimental Test Plan 5 1.4 Calibration 15 1.5 Standards 23 1.6 Presenting Data 31 1.7 Summary 35 References 35 Nomenclature 36 Problems 36 2 Static and Dynamic Characteristics of Signals 43 2.1 Introduction 43 2.2 Input/output Signal Concepts 43 2.3 Signal Analysis 48 2.4 Signal Amplitude and Frequency 51 2.5 Fourier Transform and the Frequency Spectrum 65 2.6 Summary 73 References 73 Suggested Reading 74 Nomenclature 74 Problems 74 3 Measurement System Behavior 81 3.1 Introduction 81 3.2 General Model for a Measurement System 81 3.3 Special Cases of the General System Model 85 3.4 Transfer Functions 108 3.5 Phase Linearity 110 3.6 Multiple-Function Inputs 112 3.7 Coupled Systems 114 3.8 Summary 116 References 116 Nomenclature 116 Problems 117 4 Probability and Statistics 123 4.1 Introduction 123 4.2 Statistical Measurement Theory 124 4.3 Describing the Behavior of a Population 131 4.4 Statistics of Finite-Sized Data Sets 135 4.5 Hypothesis Testing 141 4.6 Chi-squared Distribution 144 4.7 Regression Analysis 148 4.8 Data Outlier Detection 155 4.9 Number of Measurements Required 156 4.10 Monte Carlo Simulations 158 4.11 Summary 160 References 161 Nomenclature 162 Problems 162 5 Uncertainty Analysis 168 5.1 Introduction 168 5.2 Measurement Errors 169 5.3 Design-Stage Uncertainty Analysis 171 5.4 Identifying Error Sources 176 5.5 Systematic and Random Errors and Standard Uncertainties 177 5.6 Uncertainty Analysis: Multi-Variable Error Propagation 180 5.7 Advanced-Stage Uncertainty Analysis 187 5.8 Multiple-Measurement Uncertainty Analysis 193 vi5.9 Correction for Correlated Errors 205 5.10 Nonsymmetrical Systematic Uncertainty Interval 208 5.11 Summary 209 References 210 Nomenclature 210 Problems 211 6 Analog Electrical Devices and Measurements 219 6.1 Introduction 219 6.2 Analog Devices: Current Measurements 220 6.3 Analog Devices: Voltage Measurements 224 6.4 Analog Devices: Resistance Measurements 228 6.5 Loading Errors and Impedance Matching 235 6.6 Analog Signal Conditioning: Amplifiers 240 6.7 Analog Signal Conditioning: Special-Purpose Circuits 245 6.8 Analog Signal Conditioning: Filters 250 6.9 Grounds, Shielding, and Connecting Wires 261 6.10 Summary 264 References 264 Nomenclature 264 Problems 265 7 Sampling, Digital Devices, and Data Acquisition 271 7.1 Introduction 271 7.2 Sampling Concepts 272 7.3 Digital Devices: Bits and Words 280 7.4 Transmitting Digital Numbers: High and Low Signals 282 7.5 Voltage Measurements 284 7.6 Data Acquisition Systems 295 7.7 Data Acquisition System Components 296 7.8 Analog Input-Output Communication 301 7.9 Digital Input–Output Communication 306 7.10 Digital Image Acquisition and Processing 311 7.11 Summary 316 References 316 Nomenclature 317 Problems 317 8 Temperature Measurements 322 8.1 Introduction 322 8.2 Temperature Standards and Definition 323 8.3 Thermometry Based on Thermal Expansion 326 8.4 Electrical Resistance Thermometry 328 8.5 Thermoelectric Temperature Measurement 342 8.6 Radiative Temperature Measurements 365 8.7 Physical Errors in Temperature Measurement 373 8.8 Summary 382 References 383 Suggested Reading 384 Nomenclature 384 Problems 385 9 Pressure and Velocity Measurements 392 9.1 Introduction 392 9.2 Pressure Concepts 392 9.3 Pressure Reference Instruments 395 9.4 Pressure Transducers 403 9.5 Pressure Transducer Calibration 410 9.6 Pressure Measurements in Moving Fluids 412 9.7 Modeling Pressure - Fluid Systems 416 9.8 Design and Installation: Transmission Effects 416 9.9 Acoustical Measurements 421 9.10 Fluid Velocity Measuring Systems 425 Contents vii9.11 Summary 435 References 436 Nomenclature 437 Problems 438 10 Flow Measurements 442 10.1 Introduction 442 10.2 Historical Background 442 10.3 Flow Rate Concepts 443 10.4 Volume Flow Rate Through Velocity Determination 444 10.5 Pressure Differential Meters 446 10.6 Insertion Volume Flow Meters 464 10.7 Mass Flow Meters 474 10.8 Flow Meter Calibration and Standards 480 10.9 Estimating Standard Flow Rate 481 10.10 Summary 481 References 481 Nomenclature 482 Problems 483 11 Strain Measurement 487 11.1 Introduction 487 11.2 Stress and Strain 487 11.3 Resistance Strain Gauges 490 11.4 Strain Gauge Electrical Circuits 497 11.5 Practical Considerations for Strain Measurement 500 11.6 Apparent Strain and Temperature Compensation 504 11.7 Optical Strain Measuring Techniques 514 11.8 Summary 521 References 521 Nomenclature 522 Problems 523 12 Mechatronics: Sensors, Actuators, and Controls 527 12.1 Introduction 527 12.2 Sensors 527 12.3 Actuators 555 12.4 Controls 561 12.5 Summary 580 References 580 Nomenclature 580 Problems 581 Appendix A Property Data and Conversion Factors 585 Appendix B Laplace Transform Basics 592 B.1 Final Value Theorem 593 B.2 Laplace Transform Pairs 593 Reference 593 Appendix (Online Only) A Guide For Technical Writing A Guide for Technical Writing References Glossary 594 Index Index Note: Page numbers in italics refer to illustrations A Absolute viscosities, 590 AC coupling, 298 AC generators, 553 Acceleration, velocity measurement from, 540–543 Acceleration measurement, 531–537 piezoelectric accelerometer, 538, 538 with a seismic instrument, 537–539 Accelerometer, 84–85, 99, 304, 538–539 piezoelectric, 538–539, 538 vibrometer, 536 Accuracy, 17 relative accuracy, 17 Acoustical measurements, 421–425 A-weighting scale, 422, 422 condenser microphone, 423, 423 C-weighting scale, 422, 422 microphones, 423–425 signal weighting, 421–423 sound level meter (SLM), 424, 424 Acoustic wave speed, 428 Active filters, 251, 258–260 inverting bandpass, 259, 260 inverting high-pass, 259, 259 inverting low-pass, 258, 259 Lowpass Butterworth Active Filter program, 260 Sallen–Key unit-gain filter, 260 Actuators, 555–561. See also Hydraulic actuators; Linear actuators; Pneumatic actuators; Rotary actuators; Solenoids flow-control valves, 560–561 A/D converters, 299–300 Address, 281 Advanced-stage uncertainty analysis, 187–193, 189 higher-order uncertainty, 188 Nth-order uncertainty, 188–193 single-measurement uncertainty analysis, 187 zero-order uncertainty, 188 Aleatory uncertainty, 179 Alias frequencies, 274–277 folding diagram for, 275 Alloys, properties of, 585 Alternating current measurement, using analog devices, 224 American National Standards Institute (ANSI), 31, 169 American Society of Mechanical Engineers (ASME), 31, 169, 447, 454, 454–455, 553 American Society of Mechanical Engineers’ Performance Test Code (ASME PTC), 392, 553 American Society of Testing and Materials (ASTM), 31 ASTM E29—Standard Practice for Using Significant Digits, 33 Ammeter, 221, 228 Amontons, Guillaume, 322 Ampere (A), 26 Amplification, 296–299 Amplifiers, 240–245, 297–298 closed loop gain, 241 operational amplifier, 241, 242–243 Amplitude, 46 ambiguity, 277–278 of signal, 51–65 Analog devices, 219–264 analog signal conditioning, 240–245 special-purpose circuits, 245–250 connecting wires, 260–264 current measurements using, 220–224 alternating current, 224 D’Arsonval meter movement, 220, 221 direct current, 220–224 simple multirange ammeter, 221 grounds, 260–264 impedance matching, 235–240 loading errors, 235–240 measurements using, 219–264 potentiometer, 226–228 resistance measurements, 228–235 shielding, 260–264 shields, 263 voltage measurements using, 224–228 analog voltage meters, 225 oscilloscope, 225–226 Analog filters, 297 Analog input-output communication, 301–306 data acquisition modules, 301–306 Analog signal, 44, 45 conditioning, 250–261, 296–299. See also Filters amplification, 296–299 Analog-to-digital converter, 285–289 conversion error, 287–289 quantization error, 286–287 resolution, 285 saturation error, 287 Analog voltage comparator, 245–246, 245 Analog voltage meters, 225 Anemometry, 431–433. See also Doppler anemometry; Thermal anemometry Angular velocity measurements, 544–547, 546 electromagnetic techniques, 546–547 mechanical measurement techniques, 544–545 stroboscopic, 545–546, 545 ANSI. See American National Standards Institute (ANSI) Anti-aliasing filter, 276 Aperiodic signal, 47 Apparent strain, 504–514, 504 bridge static sensitivity, 507–508 practical considerations, 508–510 ASME. See American Society of Mechanical Engineers (ASME) Astable multivibrator, 248 ASTM. See American Society of Testing and Materials (ASTM) Asynchronous transmission, 307 Average value, 15, 17, 48n2, 50, 123, 342 analog signal, 45, 48 digital signal, 49–50 discrete time signal, 49–50 moving, 297 603A-weighting scale, 422, 422 Axial strain, 488 B Balance null, 226–227, 294, 346n3 Bandpass filter, 250 Barometer, 396–397 Fortin barometer, 396, 397 Base dimensions and units, 24–26 current, 26 frequency, 25 length, 25 luminous intensity, 26 mass, 24–25 measure of substance, 26 temperature, 26 time, 25 Basic DC-RMS Measurement program, 224 Bellows, 405–406 Bending beam load cell, 547, 548 Bernoulli, Daniel, 443, 452 Bernoulli effect, 446 Bessel filters, 251 design, 257–258 Best estimate, 127, 181–182, 200 Beta ratio, 448 Biaxial strain gauge rosettes, 510, 510 rectangular strain gauge rosettes, 511, 511 single plane type, 510 stacked type, 510 BIH. See Bureau International de l’Heure (BIH) Bimetallic thermometers, 327–328, 327 Binary codes, 281–282 Binary numbers, 46, 280, 283–286 Bistable multivibrator, 249 Bits, 280–282 Block diagrams, 567–569 Bluetooth communications, 307–308 Boltzmann’s constant, 366 Borda, Jean, 448 Bourdon tube, 404–405 Bourdon tube pressure gauge, 405, 405 Bragg grating, 519–520, 519 Bridge circuits, 229–230, 331, 331 Callender-Griffiths 3-wire bridge, 331, 331 Mueller 4-wire bridge, 331, 331 Wheatstone bridge, 229, 230 Bridge constant, 502–504 Bridge static sensitivity, 507–508 Buffer, 307 Bulb thermometer, 3, 3 Bureau International de l’Heure (BIH), 25 Butterworth filters, 251, 251 design, 251–252 first-order low-pass resistor-and-capacitor (RC) Butterworth filter circuit, 252, 252 improved designs, 252–257 ladder circuit for multistage high-pass LC filter, 254, 254 magnitude characteristics, 252, 253 Byte, 281 C Calibration, 15–23 accuracy, 17 dynamic calibration, 16 errors, 17, 176, 176 hysteresis, 20–21 instrument precision, 22 instrument repeatability, 22 instrument uncertainty, 23 linearity error, 21 measured value, 17 overall instrument error, 23 random errors, 17–19 random test, 21 range, 16 reproducibility, 22 resolution, 16 sensitivity error, 21–22 sequential test, 19 span, 16 standard, 15 static calibration curve, 15, 15 static calibration, 15 static sensitivity, 16 systematic errors, 17–19 true value, 17 uncertainty, 19 validation, 23 verification, 23 zero errors, 21–22 Callender-Griffiths 3-wire bridge, 331, 331 Candella, 26 Canny method, 313, 314–315 Capacitance, 28 farad (F), 28 Capacitance elements, 407–409, 408 Capillary tube viscometer, 463n2 Capsule elements, 405–406 Cascading filters, 252 Castelli, Benedetto, 4423 Catch-and-weigh technique, 480 Celsius (°C) scale, 26, 325 Central tendency, 125 Charge, 28 coulomb (C), 28 Charge amplifier, 247 Chauvenet’s criterion, 155 Chi-squared (χ2) distribution, 144–148 Goodness-of-fit test, 147–148 precision interval in a sample variance, 145–146 Circular frequency, 53 Closed-loop control, 562 Closed-loop controller, 300–301, 301 Closed loop gain, 241 Coaxial cable, 263 Combined standard uncertainty, 195, 201 Common-mode voltage (cmv), 262, 305 Comparator, 568, 568 Complete immersion thermometer, 326 Complex periodic waveform, 46 Complex waveforms, 54 Compliance, 416 Compressibility effects, 449 Concomitant methods, 14 Condenser microphone, 423, 423 Conduction errors, 374–377 Conductive plastic potentiometer, 529, 529 Confidence interval, 123, 124n2, 139, 150, 155–157, 161, 195, 209 Connecting wires, 263–264 coaxial cable, 263 optical cable, 264 single cable, 263 triaxial cable, 264 twisted pairs, 263 604 IndexContinuous variable, 6 Controlled variable, 6 Controller model, 570–572 Controls, 561–579 block diagrams, 567–569 closed-loop control, 562 dynamic response, 564–565 feedback control, 563 Laplace transforms, 565–567 on–off control, 562, 563–564 open-loop control, 562, 562 operational blocks, 568–569 oven control model, 569–573 proportional-integral (PI) Control, 573–575 Conversion error, 287–289 Conversion factors, 585–591 Conversion resolution, 287, 287 Coriolis, Gaspard de, 475 Coriolis, 475–479 flow meter, 475–479, 476–477 turndown, 462, 464, 470–471, 475, 478 uncertainty, 471–472, 478–479 Correction for correlated errors, 205–208 Correlation, 15 coefficient, 152 photon, for LDA, 432 Coulomb (C), 28 Coupled systems, 114–116, 115 Cradled dynamometers, 553–555 AC generators, 553 DC generators, 553 eddy current dynamometers, 553 waterbrake dynamometers, 553, 554–555 Critically damped system, 99 Critical pressure ratio, 460 Current, 26 ampere (A), 26 measurement, using analog devices, 220–224 4–20mA current loop, 247–248 C-weighting scale, 422, 422 D D/A converters, 300 D’Arsonval meter movement, 220, 221 Damping ratio, 101 Data-acquisition errors, 176–177, 177 Data acquisition modules, 301–306 differential-ended connection, 304–305, 305 self-contained, portable multipurpose, 303 single-ended connection, 304–305, 304 special signal conditioning modules, 305–306 USB-based, 303 Data acquisition systems (DAS), 271–316 analog signal flow scheme using, 296, 296 components, 296–301 A/D converters, 299–300 amplifiers, 297–298 analog filters, 297 closed-loop controller, 300–301 D/A converters, 300 digital filters, 297 digital input/output, 300 filters, 296–299 multiplexer, 299 offset nulling circuit, 299 shunt resistor circuits, 298–299 Data acquisition triggering, 306 Data outlier detection, 155–156 Data presentation, 31–35 full log, 32–33, 32 numerical operations, 34 plotting, 32, 32 rectangular, 32 rounding, 33–34 semi-log, 32–33, 32 significant digits, 33–35 Data-reduction errors, 177, 177 Data transmission, 307 DC component, 48 DC generators, 553 Dead volume, 407, 416 Deadweight Testers, 402–403, 402 Deflection method, 231–235 Degrees of freedom, 136 Dependent variable, 6 Derived dimensions and units, 26–30 electrical dimensions, 28–30 energy, 27 force, 27 power, 28 pressure, 28 stress, 28 Design of experiments, 82, 171 Design-stage uncertainty analysis, 171–176 in combining uncertainties, 173, 173 elemental errors, combining, RSS method, 172–173 Detailed uncertainty analysis, 171 general versus, 171 Deterministic signal, 46 Deviation, 136 Deviation plot, 145 DFT. See Discrete Fourier transform (DFT) Diaphragms, 406–409 capacitance elements, 407–409, 408 diaphragm meters, 473 piezoelectric crystal elements, 409, 409 pressure transducer using four active resistance strain gauges, 407, 407 strain gauge elements, 407 Differential-ended connection, 304–305, 305 Digit, 33 least significant digit, 33 most significant digit, 33 significant digit, 33 Digital devices, 280–282 address, 281 bits, 280–282 offset binary, 281 ones-complement binary code, 281 twos-complement binary code, 281 words, 280–282 Digital filters, 297 Digital image acquisition and processing, 311–316 Canny method, 313 edge detection methods, 314 image acquisition, 312–313, 312 image processing, 313–316 Sobel method, 313 Digital input/output, 300 Digital input–output communication, 306–311 asynchronous transmission, 307 bluetooth communications, 307–308 data transmission, 307 parity, 307 RS-232C protocol, 308 synchronous transmission, 307 Universal Serial Bus (USB), 307 Index 605Digital numbers, transmitting, 282–284 high and low signals, 282–284 methods for, 283, 283 Digital signal, 45, 46, 49–50 Digital-to-analog converter, 284–285 Digital voltmeters, 294–295 Dimension, 24 base, 24–26 derived, 26–30 electrical, 28–30 length, 25 mass, 24–25 temperature, 25–26 time, 25 Direct current measurement, using analog devices, 220–224 Direct current offset, 50–51 Discharge coefficient, 448 Discrete Fourier transform (DFT), 67–71, 272 fast Fourier transform (FFT), 68 one-sided or half-transform, 68 Discrete-time signals, 44, 45, 49–50 Discrete variable, 6 Displacement sensors, 528–531 conductive plastic potentiometer, 529, 529 dynamic response, 530–531 linear variable differential transformer (LVDT), 529–530, 529 rotary variable differential transformer (RVDT), 531 Displacement, velocity measurement from, 540–543 Distortion, 110 Doppler, Johann, 431 Doppler (ultrasonic) flow meters, 471–472 Doppler anemometry, 431–433, 435 laser Doppler anemometer (LDA), 431, 431 phase Doppler anemometry, 432 Dynamic calibration, 16 Dynamic error, 97 Dynamic measurements, 82–83 Dynamic pressure, 426 in moving fluids, 413 transducer calibration, 410–412 shock tube facility, 410, 410 Dynamic response, 564–565 Dynamic signal, 46, 47, 48 analog representations of, 48 discrete representations of, 48 Dynamometer, 550, 553 absorbing, 553 ac and dc generators, 553 cradled, 553–555 eddy current, 553 engine, 550 waterbrake, 553–555 E Earth ground, 262 Eddy current dynamometers, 553 Edge detection methods, 313, 314 Elastic behavior of materials, 489 Elastic load cell designs, 547, 548 Electrical dimensions, 28–30 capacitance, 28 charge, 28 electrical potential, 28 resistance, 28 Electrical potential, 28 volt (V), 28 Electrical resistance thermometry, 328–342 practical considerations, 335–336 resistance temperature device resistance measurement, 331–335 Electrodynamometer, 224 Electromagnetic flow meters, 464–467 Electromagnetic spectrum, 365, 365 Electromagnetic techniques, 546–547 Electronic reference junction compensation, 347 Elemental errors: combining, RSS method, 172–173 propagation of, 194–200 Emissive power, 366–367, 371–372 Energy, 27 joule, 27 Epistemic uncertainty, 180 Error(s), 17 calibration errors, 176, 176 conversion error, 287–289 data-acquisition errors, 176–177, 177 data-reduction errors, 177, 177 error fraction, 89 hysteresis error, 20, 20 linearity error, 20 overall instrument error, 23 propagation of error, 180–182 random errors, 17–19, 179 repeatability error, 20 saturation error, 287 sensitivity error, 20 sources, identifying, 176–177 systematic errors, 17–19 zero shift (null) error, 20 Euler, Leonhard, 443 Euler formula, 59 Even functions, 59–65 Expanded uncertainty, 195, 201 Expansion factor, 449–450, 452 Experimental test plan, 5–15. See also Randomization; Variables concomitant methods, 14 data reduction design plan, 6 interference, 9–10 noise, 9–10 parameter design plan, 6 repetition, 14 replication, 14 steps in, 6 system and tolerance design plan, 6 Extraneous variables, 7 F Fahrenheit, Gabriel D., 323 Fahrenheit (°F), 26 Farad (F), 28 Faraday, Michael, 465, 530 Fast Fourier transform (FFT), 68 Feedback control, 4, 563 Fiber Bragg strain measurement, 519–520, 519 Filter band, 106 Filters, 250–261, 296–299. See also Bessel filters; Butterworth filters active filters, 251, 258–260 analog, 297 bandpass filter, 250 Butterworth filters, 251 cascading filters, 252 characteristics, 250, 250 digital, 297 high-pass filter, 250 low-pass filter, 250 notch filter, 250 passband, 250 606 Indexpassive analog filter circuits, 251 roll-off, 251 stopband, 250 Final value theorem, 593 Finite-sized data sets, statistics of, 135–141 finite statistics, 135 inferential statistics, 135 repeated tests and pooled data, 140–141 standard deviation of the means, 136–140 Finite statistics, 135 First-order systems, 87–98 frequency response, 95 determination of, 98 magnitude ratio, 96, 97 phase shift, 96, 97 simple periodic function input, 94–98 step function input, 88–90 time constant, 88 First-order uncertainty, 188–190 Fixed point temperatures, 323–324 Flip-flop circuits, 248–250 Flip-flop multivibrator, 249, 249 Flow coefficient, 448–449, 451, 561 Flow-control valves, 560–561, 560 Flow measurements, 442–481. See also Insertion volume flow meters; Mass flow meters; Pressure differential meters Bernoulli effect, 446 flow meter calibration and standards, 480–481 historical background, 442–443 mass flow rate, 442 standard flow rate, estimating, 481 volume flow rate, 442 through velocity determination, 444–446 Flow nozzle, 447, 454–460 Flow rate concepts, 443–444 Fluid velocity measuring systems, 425–435 particle image velocimetry (PIV), 433–434, 433 pitot–static pressure methods, 434–435 pitot-static pressure probe, 426–428, 427 thermal anemometry, 428–431, 429 velocity measuring methods, 434–435 Folding diagram, 275–276, 275 Force, 27 load cells, 547–550 measurement, 547–550 Newton, 27 Fortin barometer, 396, 397 Fossilization, 194 Fourier analysis, 51 Fourier coefficients, 58–59 Fourier series, 57–58 Cosine Series, 59 fundamental, 58 Sine Series, 59–65 Fourier transform, 65–73 discrete Fourier transform (DFT), 67–71 inverse Fourier transform, 66 Francis, James, 452 Freeman, John Ripley, 455 Frequency, 25, 43. See also Nyquist frequency Frequency analysis, 54–57 Frequency bandwidth, 97 Frequency distribution, 126 Frequency of signal, 51–65 Frequency response, 95 Frequency spectrum, 65–73 Frontinius, Sextus, 443 Full field IR imaging, 372–373 Full-log coordinate format, 33 Functions: even function, 59–65 odd function, 59–65 with T= 2π, 59 Fundamental Fourier series, 58 Fundamental frequency, 58 G Galvanometer, 222, 227, 227 Gases, transmission effects, 418–420 Gauge factor, 494–495 Gauge length, 493, 496 General measurement system, 2–5 components, 4, 5 General model for measurement system, 81–85 General purpose interface bus (GPIB), 307–308, 308 General system model, 85–108 first-order systems, 87–98. See also individual entry second-order systems, 98–108. See also individual entry static sensitivity (K), determination, 86 zero-order systems, 85–87 General template for measurement system, 4–5 General versus detailed uncertainty analysis, 171 Goodness-of-fit test, 147–148 Gosset, William, 136, 136n5 GPIB. See General purpose interface bus (GPIB) Ground loops, 262 Grounds, 260–264 H Hall effect, 224 Handshake, 306 Harmonics, 58 Heat flux, 359–362 heat flux sensor, 359 Heat flux sensor, 359 construction of, 359, 359 thin-film heat flux sensor, 360, 360 Heavily damped systems, 420–421 Hero of Alexandria, 442 Herschel, Clemens, 452 Herschel venturi meter, 451, 453 Hierarchy of standards, 30–31 Higher-order uncertainty, 188 High-pass filter, 250 Histogram, 126 Hooke’s law, 489 Hot-film sensor, 429, 435 Hot-wire sensor, 429, 431, 435 Hydraulic actuators, 556–558 Hypothesis testing, 141–144 p-value, 143 t-test, 143 z-test, 142 Hypsometer, 388 Hysteresis, 20–21 Hysteresis error, 20, 20 I Image acquisition, 312–313, 312 Image processing, 313–316 Impact cylinder, 414, 414 Impedance matching, 235–240 Imread function, 313 Imshow function, 313 Inch-pound (I-P) unit system, 24 Inclined tube manometer, 398, 399 Index 607Independent variables, 6 Inertance, 416 Inferential statistics, 135 Infinite statistics, 135 Input, 43 Input/output signal concepts, 43–47 generalized behavior, 44 measurement system selection, 43, 44 signal waveforms, 46–47 waveforms, classification, 44–46 Insertion errors, 373–374 Insertion volume flow meters, 464–474 diaphragm meters, 473 Doppler (ultrasonic) flow meters, 471–472 electromagnetic flow meters, 464–467 positive displacement meters, 472–474 rotameters, 469–470, 469 rotating vane meters, 473 transit time flow meters, 471–472 turbine meters, 470–471 vortex shedding meters, 467–469, 467–468 wobble meters, 473 Instrument error: common elements of, 20, 20 hysteresis error, 20 linearity error, 20 repeatability error, 20 sensitivity error, 20 zero shift (null) error, 20 Instrument Precision, 22 Instrument repeatability, 22 Instrument uncertainty, 23, 172 Interference, 9–10, 10 International Bureau of Weights and Measures (BIPM), 24 International Organization for Standardization (ISO), 31, 169, 179 International Temperature Scale of 1990 (ITS-90), 325 Interpolation, 324 standards for, 325–326 Interstage loading errors, 236–240 Inverse Fourier transform, 66 Inverting bandpass active filter, 259, 260 Inverting high-pass active filter, 259, 259 Inverting low-pass active filter, 258, 259 J Joule, 27 Junction, 312 K Kelvin (K) scale, 26, 325 K-factor, 468 Kiel probe, 414, 414 Kinematic viscosities, 591 King’s law, 429 L Laminar flow elements, 463–464 Laplace transform analysis, 571 Laplace transform basics, 592–593 Laplace transform pairs, 593 Laplace transforms, 565–567 Laser Doppler anemometer (LDA), 431, 431, 435 Lateral strains, 489–490 Law of homogeneous materials, 345 Law of intermediate materials, 345 Law of successive or intermediate temperatures, 346 LDA. See Laser Doppler anemometer (LDA) Leakage, 278–280 Least significant digit, 33 Least-squares regression analysis, 149–152 Leibniz, Gottfried Wilhelm, 57n4 Length, 25 Level of significance, 142 Light, characteristics, 515 Linear actuators, 555–556 screw-drive linear motion, 556 slider–crank mechanism, 555–556 using lead screw, 556, 556 Linear polynomials, 152–155 Linear variable differential transformer (LVDT), 405, 529–530, 529 LVDT gauge head, 531, 532 Linear velocity measurements, 539 Linearity error, 20, 21 Linkwitz–Riley high-pass or low-pass filter, 256, 257 Linnaeus, Carolus, 323 Liquid-in-glass thermometer, 324, 324, 326, 326–327 complete immersion thermometer, 326 partial immersion thermometer, 327 total immersion thermometer, 327 Liquids, transmission effects, 418 Load cells, 547–550 bending beam load cell, 547, 548 elastic load cell designs, 547, 548 piezoelectric load cells, 547–550 design, 548, 549 proving ring, 549–550, 550 shear beam load cell, 547, 549 strain gauge load cells, 547 Loading errors, 235–240 interstage loading errors, 236–240 for voltage-dividing circuit, 236–237, 236 Lowpass Butterworth Active Filter program, 260 Low-pass filter, 250 low-pass Butterworth filter, 251, 251 Luminous Intensity, 26 candella, 26 LVDT. See Linear variable differential transformer M Mach number, 381–382, 411 Magnitude, 43 magnitude ratio, 96 Manometer, 397–402 inclined tube manometer, 398, 399 micromanometer, 398, 399 U-tube manometer, 397, 398 Mass, 24–25 Mass flow meters, 474–480 Coriolis flow meter, 475–479, 476–477 thermal flow meter, 474–475 McLeod gauge, 395–396, 396 Mean value, 48, 48n2, 123–125, 127, 130–131, 136–141, 155, 170, 180– 182, 186, 200, 202–205, 298 digital signal, 49–50 discrete time signal, 49–50 sample mean, 124, 135–140, 155, 170, 180 true mean, 7, 125, 130–131, 136, 138–141 Measurand, 124 Measured value, 17 Measured variable, 2, 124 Measurement errors, 169–171 repeated measurements, distribution of errors on, 169, 170 Measurement methods, 1–35. See also Calibration; Experimental test plan; Standards basic concepts, 1–35 experimental test plan, 5–15 608 Indexfeedback-control stage, 4 general measurement system, 2–5 general template for, 4–5 output stage, 4 sensor, 2–4 signal conditioning stage, 4 transducer, 2–4 Measurement random standard uncertainty, 195 Measurement system behavior, 81–116. See also General system model coupled systems, 114–116, 115 dynamic measurements, 82–83 general model for, 81–85 multiple-function inputs, 112–114 phase linearity, 110–112 transfer functions, 108–110 Measurement systematic standard uncertainty, 195 Mechanical measurement techniques, 544–545, 544 Mechanical power measurements, 551–555 cradled dynamometers, 553–555 prony brake, 552, 552 rotational speed, 551–552 shaft power, 551–552 torque, 551–552 Mechatronics, 527–579. See also Actuators; Controls; Force: measurement; Sensors; Velocity measurements Metallic gauges, 491–493 metallic foil strain gauge, 493, 493 Method of least-squares, 149 Metrology, 169 Micromanometer, 398, 399 Microphones, 423–425 Modified three-sigma test, 155 Moiré methods, 517–519, 518 Mole, 26 Monostable multivibrator, 249 Monte Carlo simulations, 158–160, 158, 187 Most significant digit, 33 Moving coil transducers, 543–544, 543 Moving fluids, 412–415. See also Pressure measurements in moving fluids Mueller 4-wire bridge, 331, 331 Multiple-function inputs, 112–114 Multiple gauge bridge, 501–502 Multiple-junction thermocouple circuits, 357–359 Multiple-measurement uncertainty analysis, 193–205, 194 combined standard uncertainty, 195, 201 elemental errors, propagation of, 194–200 expanded uncertainty, 195, 201 propagation of elemental systematic uncertainties, 194–195 propagation of uncertainty to a result, 200–205 Welch–Satterthwaite formula, 201 Multiplexer, 299, 300 Multi-variable error propagation, 180–187 Monte Carlo method, 187 propagation of error, 180–182 sensitivity index, approximating, 182–184 sequential perturbation, 184–186 Multivibrator, 248–250, 248 astable, 248 flip-flop/bistable multivibrator, 249, 249 monostable, 249 TTL signal, 248 N Narrow band infrared temperature measurement, 370–373 full field IR imaging, 372–373 fundamental principles, 370–371 two-color thermometry, 371–372 National Institute of Standards and Technology (NIST), 326, 347, 350, 355, 363–365, 480–481 Natural frequency, 101 Negative temperature coefficient (NTC), 328 Newton, Sir Isaac, 443 Newton, 27 NIST. See National Institute of Standards and Technology (NIST) Noise, 9–10, 10 Nondeterministic signal, 47 Nonsymmetrical systematic uncertainty interval, 208–209 Normal (or gaussian) distribution, 131 Normal error function, 132 Normal stress, 487 Notch filter, 250 NTC. See Negative temperature coefficient (NTC) Nth-order uncertainty, 188–193 Null method, 230–231 Numerical operations, 34 Nyquist frequency, 275, 297 O Obstruction meters, 447–449 compressibility effects, 449 selection, 461–463 accuracy, 462 costs, 461 placement, 461 pressure loss, 461 turndown, 462–463 square-edged orifice plate meter, 447, 447 standards for, 449 Odd functions, 59–65 Offset binary, 281 Offset nulling circuit, 299 Ohm (Ω), 28 Ohmmeter circuits, 228–229 multirange ohmmeter circuits, 228, 229 Ones-complement binary codes, 281 One-shot circuit, 249 One-sided or half-transform, 68 On–off control, 562, 563–564 Open-loop control, 562, 562 Operational amplifier, 241, 242–243 Operational blocks, 568–569 single-input, single-output amplifier block, 568, 568 temperature-input, voltage-output amplifier block, 568, 568 Optical cable, 264 Optical fiber thermometer, 370, 370 Optical strain measuring techniques, 514–515 Orifice meter, 449–451 square-edged orifice meter, 449, 450–451 Orifice plate, 447 Oscilloscope, 225–226 Outlier, 155–156 Chauvenet’s criterion, 155–156 three-sigma test, 155 Output, 4, 43 Output stage, 4 Oven control model, 569–573, 570, 573 controller model, 570–572 Laplace transform analysis, 571 plant model, 569–570 step response, 572–573 Overall instrument error, 23 Overdamped system, 99 P Parallel communications, 308–311 Parallel converters, 293–294 Index 609Parameter, 6 Parity, 307 Partial immersion thermometer, 327 Particle image velocimetry (PIV), 433–435, 433 Pascal (Pa), 28 Passband, 250 Passive analog filter circuits, 251 Peltier, Jean Charles Athanase, 344 Peltier coefficient, 344 Peltier effect, 344 Period, 53 Periodic signals, 52–54 spring-mass system, 52, 53 Perturbation, sequential, 184–186 Phase Doppler anemometry, 432 Phase linearity, 110–112 Phase shift, 95 Photoelastic measurement, 515–517 plane polariscope, 516, 517 Physical errors in temperature measurement, 373–382 conduction errors, 374–377 errors associated with temperature sensors, 374 insertion errors, 373–374 probe design, 376–377 radiation errors, 377–379 radiation shielding, 379–380 random errors, 374 recovery errors, 380–382 systematic errors, 374 PI. See Proportional-integral (PI) control PID. See Proportional integral–derivative (PID) control Piezoelectric accelerometer, 538, 538 Piezoelectric crystal elements, 409, 409 Piezoelectric load cells, 547–550, 549 Pitot–static pressure methods, 434–435 Pitot-static pressure probe, 426–428, 427 Pitot tube, 414, 414 PIV. See Particle image velocimetry (PIV) Place value, 33 Planck’s constant, 366 Plane polariscope, 516, 517–518 Plant model, 569–570 Platinum resistance temperature device (RTD), 331–336 PLC. See Programmable logic controller (PLC) Plotting formats, 32, 32 full-log coordinate format, 33 rectangular coordinate format, 32 semilog coordinate format, 32–33 Pneumatic actuators, 556–558, 558 Poiseulle, Jean, 463 Poisson’s ratio, 406, 489, 491, 495 Polarization of light, 515, 515 Pooled data, 140–141 Pooled mean, 140 Pooled standard deviation, 140 Pop test, 411 Population behavior, 131–135 Positive displacement meters, 464, 472–474 Positive temperature coefficient (PTC), 328 Potentiometer pressure transducer, 405, 406 Potentiometer, 226–228 instruments, 227–228 voltage divider circuit, 227, 227 Power, 28 watt (W), 28 Prandtl tube for static pressure, 415, 415 Precision interval in a sample variance, 145–146 Pressure, absolute, 87, 392–394, 396, 404, 411 Pressure concepts, 28, 392–395 pascal (Pa), 28 relative pressure scales, 393, 393 Pressure differential meters, 446–464 flow nozzles, 454–460 laminar flow elements, 463–464 obstruction meters, 447–449 selection, 461–463 orifice meter, 449–451 sonic nozzles, 460–461 venturi meter, 451–454 Pressure-fluid systems, modeling, 416 Pressure measurements, 392–435. See also Transmission effects in moving fluids, 412–415 dynamic pressure, 413 stagnation, 413 static pressure, 413–415 total pressure measurement, 413–414 total pressure, 413 Pressure reference instruments, 395–403 barometer, 396–397 deadweight testers, 402–403, 402 inclined tube manometer, 398, 399 manometer, 397–402 McLeod gauge, 395–396, 396 micromanometer, 398, 399 U-tube manometer, 397, 398 Pressure sensors, elastic elements as, 403, 404 Pressure transducers, 403–410. See also Diaphragms bellows, 405–406 Bourdon tube, 404–405 calibration, 410–412 dynamic Calibration, 410–412 static calibration, 410 capsule elements, 405–406 diaphragms, 406–409 potentiometer pressure transducer, 405, 406 pressure sensors, elastic elements as, 403, 404 Primary standard, 24 Primary unit standards, 24 Probability, 123–167. See also Chi-squared (χ2) distribution; Probability density functions; Regression analysis Monte Carlo simulations, 158–160 number of measurements required, 156–158 Probability density functions, 125–131 standard statistical distributions, 128–129 binomial, 129 log normal, 128 normal, 128 Poisson, 129 rectangular, 128 triangular, 128 Programmable logic controller (PLC), 4 Prony brake, 552, 552 Propagation: of elemental systematic uncertainties, 194–195 of uncertainty to a result, 200–205 Property data, 585–591 thermophysical properties, 586–587 Proportional integral–derivative (PID) control, 575–579, 579 proportional control, 578–579 of a second-order system, 575–579, 577 Proportional-integral (PI) control, 573–575, 574 integral control, 573–574 time response, 575 Provers, 480 Proving ring, 549–550, 550 610 IndexP-value, 143 Pyranometer construction, 368 Pyrometry, 369–370 Q Quantization, 45, 285 quantization error, 286–287 R Radiation blackbody, 325, 366 detectors, 366–368 emissive power, 366–367, 371–372 errors, 377–379 shield, 379–380 temperature measurement, 365–373 wavelength distribution, 366 Radiative temperature measurements, 365–373 narrow band infrared temperature measurement, 370–373 optical fiber thermometer, 370, 370 pyrometry, 369–370 radiation detectors, 366–368 radiation fundamentals, 365–366 radiometer, 367–369, 367 Radiometer, 367–369, 367 pyranometer construction, 368 Ramp (integrating) converters, 291–293, 291–292 Random errors, 17–19, 18, 179, 374 Random standard uncertainty, 179 Random test, 21 Random uncertainty, 124, 139, 179 Random variable, 125 Randomization, 10–13 Range, 16, 43 Rayleigh relation, 428 Recovery errors in temperature measurement, 380–382 Rectangular coordinate format, 32 Rectangular distribution, 159, 171, 179n5, 187, 193, 209 standard uncertainty, 187 Reference junction, 347 Regression analysis, 148–155 least-squares regression analysis, 149–152 linear polynomials, 152–155 Relative accuracy, 17 Relative pressure scales, 393, 393 Repeatability, 22 Repeatability error, 20 Repeated measurements, distribution of errors on, 169, 170 Repeated tests, 140–141 Repetition, 14 Replication, 14 Reproducibility, 22 Resistance, 28, 416 ohm (Ω), 28 Resistance measurements, 228–235 bridge circuits, 229–230 deflection method, 231–235 Null method, 230–231 ohmmeter circuits, 228–229 Resistance strain gauges, 490–497 configurations, 494 delta rosette, 494 diaphragm pattern, 494 linear pattern, 494 rectangular rosette, 494 residual stress pattern, 494 stacked rosette, 494 tee pattern, 494 torque rosette, 494 gauge factor, 494–495 metallic gauges, 491–493 semiconductor strain gauges, 495–497 strain gauge construction and bonding, 493–495 Resistance temperature detectors (RTDs), 328–330, 329, 428, 475 platinum RTDs, 331–336 Resistance temperature device resistance measurement, 331–335 Resolution, 16, 285 conversion resolution, 287, 287 Resonance band, 104 Resonance frequency, 105 Reynolds number, 6 Ringing frequency, 101 Rise time of system, 89, 101 Roll-off, 251 Root-mean-square analog signal, 49 Root-sum-squares (RSS) method, 172 Rotameters, 469–470, 469 Rotary actuators, 558–560 stepper motors, 558–560, 559 Rotary variable differential transformer (RVDT), 531, 533 Rotating vane meters, 473 Rotational speed, 551–552 Rounding, 33–34 RS-232C protocol, 308 RTDs. See Resistance temperature detectors (RTDs) Ruge, Arthur, 491 RVDT. See Rotary variable differential transformer (RVDT) S Sallen–Key unit-gain filter, 260–261, 260 Sample-and-hold circuit (SHC), 246–247 Sample mean value (), 135 Sample standard deviation (sx), 135 Sample variance (s2x), 135 Sampling, 271–316 alias frequencies, 274–277 amplitude ambiguity, 277–278 anti-aliasing filter, 276 concepts, 272–280 leakage, 278–280 sample rate, 272–274, 272–273 waveform fidelity, 280 Sampling theorem, 274 Saturation error, 287 Screw-drive linear motion, 556 Second-order systems, 98–108 ringing frequency, 101 rise time, 101 settling time, 101 simple periodic function input, 103–104 step function input, 100–103 system characteristics, 104–108 Seebeck, Thomas Johann, 343 Seebeck effect, 343–344 Seismic transducer, 531–537, 534–535 Semiconductor strain gauges, 495–497 Semilog coordinate format, 32–33 Sensitivity error, 20, 21–22 Sensitivity index, approximating, 182–184 Sensors, 2–4, 527–555. See also Displacement sensors; Load cells acceleration measurement, 531–537 atomic force microscope, sensor stage of, 2–3 displacement sensors, 528–531 potentiometer construction, 528, 528 rotary variable differential transformer, 531, 533 Index 611Sensors (Continued ) seismic transducer, 531–537 torque measurements, 550–551 vibration measurement, 531–537 Sequential perturbation, 184–186 Sequential test, 19 Settling time, 101 Shaft power, 551–552 SHC. See Sample-and-hold circuit (SHC) Shear beam load cell, 547, 549 Shielding, 260–264 Shields, 263 Shock tube facility, 410, 410 Shunt resistor circuits, 298–299 Signal, 43–73. See also Input/output signal concepts amplitude, 51–65 analysis, 48–51 digital signals, 49–50 direct current offset, 50–51 discrete-time signals, 49–50 signal root-mean-square value, 49 conditioning, 4 strain measurement and, 512–514 definition, 44 dynamic characteristics of, 43–73 frequency, 51–65 periodic signals, 52–54 static characteristics of, 43–73 Signal root-mean-square value, 49 Signal waveforms, 46–47 aperiodic, 47 deterministic signal, 46 dynamic signal, 46, 47 nondeterministic signal, 47 simple periodic waveform, 46 static signal, 46 steady periodic signal, 46 Signal weighting, 421–423 A-weighting scale, 422, 422 condenser microphone, 423, 423 C-weighting scale, 422, 422 Signals analysis in frequency space, 71–73 Significant digits, 33–35 Simmons, Edward, 491 Single cable, 263 Single-ended connection, 304–305, 304 Single-measurement uncertainty analysis, 187, 189 Single-tailed test, 142 Slider–crank mechanism, 555–556 Simple multirange ammeter, 221 Simple periodic function input, 94–98, 103–104 Simple periodic waveform, 46 Sobel method, 313, 314–315 Solenoids, 557–558, 558 Sonic nozzles, 460–461 Sound level meter (SLM), 424, 424 Span, 16 Special-purpose circuits, 245–250 analog voltage comparator, 245–246, 245 astable multivibrator, 248 charge amplifier, 247 4–20mA current loop, 247–248 flip-flop circuits, 248–250 multivibrator, 248–250 sample-and-hold circuit (SHC), 246–247 Special signal conditioning modules, 305–306 Square-edged orifice meter, 449, 450–451 Square-edged orifice plate meter, 447, 447 Stagnation in moving fluids, 413 Standard, 15 Standard cubic feet per minute (SCFM), 481 Standard cubic meters per minute (SCMM), 81 Standard deviation, 22, 130 of the means, 136–140 Standard error of the fit, 150 Standard flow rate, estimating, 481 Standard statistical distributions, 128–129 binomial, 129 log normal, 128 normal, 128 Poisson, 129 rectangular, 128 triangular, 128 Standard thermocouple voltage, 349–350, 350 Standardized normal variate, 131 Standards, 23–31. See also Base dimensions and units; Derived dimensions and units hierarchy, 30–31 primary, 24 temperature, 26 test, 31 Static calibration, 15 Static pressure in moving fluids, 413, 413n2 Static pressure measurement in moving fluids, 414–415 Prandtl tube for static pressure, 415, 415 static pressure wall tap, 414, 414 Static pressure transducer calibration, 410 Static sensitivity (K), 16, 86 determination, 86 Static signal, 46 Statistical measurement theory, 124–131. See also Probability Density Functions Steady periodic signal, 46 Step function input, 88–90 Stepper motors, 558–560, 559 Stiffness, 416 Stopband, 250 Strain, 487–490. See also Resistance strain gauges axial strain, 488 lateral strains, 489–490 Strain gauge electrical circuits, 497–500 elements, 407 interface, 305, 306 load cells, 547 Wheatstone bridge circuit, 498 Strain measurement, 487–520 apparent strain, 504–514 biaxial strain gauge rosettes, 510, 510 bridge constant, 502–504 fiber Bragg strain measurement, 519–520 Moiré methods, 517–519 multiple gauge bridge, 501–502 optical strain measuring techniques, 514–515 photoelastic measurement, 515–517 practical considerations for, 500–504 signal conditioning, 512–514 strain gauge data, analysis, 510–512 temperature compensation, 505–507 Stream pressure, 413n2 Stress, 28, 487–490 biaxial state of stress, 489, 490 normal stress, 487 pascal (Pa), 28 Stroboscopic angular velocity measurements, 545–546, 545 Student’s t distribution, 136 612 IndexSubstance measure, 26 mole, 26 Successive approximation converters, 289–295, 290 digital voltmeters, 294–295 parallel converters, 293–294 ramp (integrating) converters, 291–293, 291 Synchronous transmission, 307 Systematic errors, 17–19, 124n1, 177–179, 374 Systematic standard uncertainty, 177 Systematic uncertainty, 178 T Temperature, 26 celsius (°C), 26 and definition, 323–326 fahrenheit (°F), 26 kelvin (K), 26 standards, 323–326 Temperature compensation bridge arrangements for, 507, 507 common gauge mountings, 506 and strain measurement, 505–507 Temperature measurements, 322–382. See also Electrical resistance thermometry fixed point temperatures, 323–324 historical background, 322–323 interpolation, 324 liquid-in-glass thermometer, 324, 324 physical errors in, 373–382. See also individual entry scales and standards, 325–326 t estimator, 136 Test plan, 5–14. See also Experimental test plan Test standards and codes, 31 The principle of superposition, 112 Thermal anemometer, 435 Thermal anemometry, 428–431, 429 hot-wire probe, 429, 429 operating modes, 429 Thermal flow meter, 474–475 Thermistors, 336–342, 336 circuits, 336, 337 Thermocouple, 342, 343 basic temperature measurement with, 346–347, 347 multiple-junction thermocouple circuits, 357–359 in parallel, 358–359, 358 Thermocouple voltage measurement, 350–357 thermocouple reference table, 351–353 Thermoelectric temperature measurement, 342–365 applications for, 359–362 data acquisition considerations, 362–365 fundamental thermocouple laws, 345–346 Peltier effect, 344 reference junction, 347 Seebeck effect, 343–344 standard thermocouple voltage, 349–350, 350 thermocouple standards, 347–350 Thomson effect, 344–345, 345 Thermometer bimetallic, 327–328 complete immersion, 326 electrical resistance, 328–342 liquid-in glass, 326–327 optical fiber, 370 partial immersion, 327 platinum resistance, 31, 325–326, 331 radiation, 365 total immersion, 327 Thermometry based on thermal expansion, 326–328 bimetallic thermometers, 327–328 liquid-in-glass thermometers, 326–327 Thermophysical properties, 586–587 of air, 589 of metallic solids, 586–587 of saturated water (liquid), 588 Thermopiles, 357–358, 357 Thin-film heat flux sensor, 360, 360 Thomson, William (Lord Kelvin), 26, 344, 491 Thomson effect, 344–345, 345 Three-sigma test, 155 Thresholding, 313 Time, 25 time constant, 88, 90 Tolerance design plan strategy, 6n3 Torque, 551–552 measurements, 550–551 shaft instrumented for, 551, 551 Torricelli, Evangelista, 396, 451 Total immersion thermometer, 327 Total pressure in moving fluids, 413 Total pressure measurement, 413–414 impact cylinder, 414, 414 Kiel probe, 414, 414 Pitot tube, 414, 414 Transducers, 2–4 atomic force microscope, transducer stage, 3 for shock and vibration measurement, 538–539 Transfer functions, 108–110 operation of, 108, 109 Transit time flow meters, 471–472 Transmission band, 105 Transmission effects, 416–421 design and installation, 416–421 equivalent lumped parameter network, 417, 417 gases, 418–420 heavily damped systems, 420–421 liquids, 418 Triangular distribution, 128 Triaxial cable, 264 True mean value, 130 True value, 17 True variance, 130 T-test, 143 TTL signal, 248 Turbine meters, 470–471 Twisted pairs, 263 Two-color thermometry, 371–372 Twos-complement binary codes, 281 Two-tailed test, 142 Type A uncertainty, 179 Type B uncertainty, 179 U Uncertainty, 19 propagation, 172 Uncertainty analysis, 168–209. See also Advanced-stage uncertainty analysis; Multiple-measurement uncertainty analysis; Multi-variable error propagation advanced-stage, 187–193 aleatory uncertainty, 179 correction for correlated errors, 205–208 design-stage, 171–176 epistemic uncertainty, 180 error sources, identifying, 176–177 general versus detailed, 171 measurement errors, 169–171 multiple-measurement, 193–205 Index 613Uncertainty analysis (Continued ) nonsymmetrical systematic uncertainty interval, 208–209 standard uncertainties, 177–180 systematic error, 177–179 Type A uncertainty, 179 Type B uncertainty, 179 Underdamped system, 99–101, 104–105, 261, 410 Unit, 24 Unit step function, 88, 88 Universal Serial Bus (USB), 307 U.S. Engineering Unit System, 24–25 U-tube manometer, 397, 398 V Validation, 23 Valves, 560–561 Variables, 6–9 continuous, 6 controlled variable, 6 dependent, 6 discrete, 6 extraneous, 7 independent, 6 parameter, 6 Velocity measurements, 392–435, 539–544. See also Angular velocity measurement; Fluid Velocity measuring systems Doppler anemometry, 435 laser Doppler anemometer (LDA), 435 linear velocity measurements, 539 particle image velocimetry (PIV), 435 pitot–static pressure methods, 434–435 selection of, 434–435 thermal anemometer, 435 velocity from displacement or acceleration, 540–543 Venturi, Giovanni, 452, 460 Venturi meter, 447, 451–454 Herschel venturi meter, 451, 453 Verification, 23 Vibration measurement, 531–537 transducers for, 538–539 Vibrometer, 536 Viscosity absolute, 437, 533, 590 kinematic, 427, 444, 470, 591 Volt (V), 28 Voltage analog measurement, 224–228 digital measurement, 284–295 Voltage divider circuit, 227, 227 Voltage measurements, 284–295 analog-to-digital converter, 285–289 digital-to-analog converter, 284–285 quantization, 285 using analog devices, 224–228 Voltage-divider principles, 528n2 Voltage-dividing circuit, loading errors for, 236–237, 236 Voltmeters, 225 Volt-ohmmeters (VOMs), 225 Volume flow rate through velocity determination, 444–446 von Karman, Theodore, 467 Vortex shedding meters, 467–469, 467–468 W Water, thermophysical properties, 588 Waterbrake dynamometers, 553, 554–555 Watt (W), 28 Waveforms, 43 classification, 44–46, 47. See also Signal waveforms analog signal, 44, 45 analog-to-digital (A/D) converter, 46 digital signal, 45, 46 discrete time signal, 44, 45 fidelity, 280 Weisbach, Julius, 460 Welch–Satterthwaite formula, 201 Wheatstone bridge, 229, 230 voltage-sensitive Wheatstone bridge, 231, 231 Wobble meters, 473 Words, 280–282 Y Young’s modulus, 489 Z Zero errors, 21–22 Zero-order systems, 85–87 Zero-order uncertainty, 171, 188 Zero shift (null) error, 20 Zeroth law of thermodynamics, 323 z-test, 142 z variable, 131, 136, 142 614 IndexCONVERSION FACTORS* MASS 1 lb m = 0.4536 kg 1 slug = 14.5939 kg LENGTH 1 inch = 0.0254 m 1 ft = 0.3048 m 1 km = 1000 m = 1 × 103 m 1 cm = 0.01 m = 0.3937 in. = 0.0328 ft 1 mm = 0.001 m = 1 × 103 m 1 μm = 0.000001 m = 1 × 106 m 1 nm = 0.000000001 m = 1 × 109 m 1 mi = 5280 ft = 1.6093 km 1 l.y. = 9.4605 × 1015 m AREA 1 ft2 = 0.0929 m2 1 cm2 = 1 × 104 m2 = 0.155 in.2 VOLUME 1 L = 1000 cm3 = 0.2642 gal = 1 × 103 m3 1 gal = 231.0 in.3 = 0.1337 ft3 1 gal = 3.7854 L = 0.003785 m3 1 ft3 = 28.3168 L = 0.0283 m3 TIME 1 min = 60 s 1 h = 60 min = 3600 s 1 day = 8.6400 × 104 s FORCE 1 N = 1 kg-m/s2 = 1 × 105 dynes 1 lb = 4.4482 N 1 kgf = 9.80665 N PRESSURE OR STRESS 1 Pa = 1 N/m2 1 lb/in2 = 6894.757 Pa 1 atm = 14.6959 lb/in.2 = 760 Torr = 101,325 Pa 1 bar = 14.5038 lb/in.2 = 1 × 105 Pa = 750 Torr 1 dyn/cm2 = 0.10 Pa 1 inch Hg = 3386.38 N/m2 1 inch H2O = 2.54 cm H2O = 249.089 Pa = 0.0361 lb/in.2 1 Torr = 1 mm Hg = 133.322 Pa 1 μstrain = 106 m/m = 106 in/in TEMPERATURE K = °C + 273.15 1°C = 1.8°F = 1 K °F = 1.8°C + 32 °R = °F + 459.67 VOLUME FLOW RATE 1 gal/min = 0.00223 ft3/s = 0.06309 L/s 1 m3/min = 35.315 ft3/min = 1 × 106 cm3/min ANGLE 1° = 0.01745 rad 1´ = 2.909 × 104 rad 1 revolution = 2π rad ROTATION 1 rev/s = 2π rad/s = 6.2832 rad/s 1 rpm = 1 rev/min = 0.1047 rad/s FREQUENCY 1 Hz = 2π rad/s * Many of these conversion factors have been rounded off.MOMENT OR TORQUE 1 lb-ft = 1.3558 N-m POWER 1 W = 1.0 J/s = 860.42 cal/hr 1 hp = 550.0 ft-lb/s = 745.6999 W 1 kW = 1 × 103 W 1 Btu/hr = 778.1692 ft-lb/hr = 0.2931 W ENERGY 1 J = 1.0 N-m = 1 × 107 ergs 1 erg = 1 dyne-cm 1 cal = 4.1868 J 1 ft-lb = 1.3558 J 1 Btu = 1055.0558 J VISCOSITY 1 lb-s/ft2 = 47.880 N-s/m2 1 centipoise = 0.01 dyne-s/cm2 = 0.001 Pa-s SPECIFIC HEAT 1 Btu/lbm-°F = 4.1868 kJ/kg-°C GAS CONSTANT 1 ft-lb/lbm-°R = 5.380 J/kg-K THERMAL CONDUCTIVITY 1 Btu/hr-ft-°F = 1.7307 W/m-°C HEAT TRANSFER COEFFICIENT 1 Btu/hr-ft2-°F = 5.6786 W/m2-°C BULK MODULUS 1 × 106 psi = 6.895 × 109 Pa PHYSICAL CONSTANTS Standard Acceleration of Gravity g = 9.80665 m/s2 = 32.1742 ft/s2 Speed of Light c = 2.998 × 108 m/s Planck’s Constant h p = 6.6261 × 1034 J-s Stefan-Boltzmann Constant σ 5:6704 108 W/m2-K4 0:1712 108Btu/h-ft2-°R4 Universal Gas Constant R 8:3143 J/gmole-K 1:9859 Btu/lbmole-°R
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