كتاب Encyclopedia of Materials Characterization

قُلْ بِفَضْلِ اللَّهِ وَبِرَحْمَتِهِ فَبِذَٰلِكَ فَلْيَفْرَحُوا هُوَ خَيْرٌ مِمَّا يَجْمَعُونَ

Contents

Preface to Series ix

Preface x

Acronyms Glossary xi

Contributors xvi

INTRODUCTION AND SUMMARIES

1.0 Introduction I

Technique Summaries 7-56

IMAGING TECHNIQUES (MICROSCOPY)

2.0 Introduction 57

2.1 Light Microscopy 60

2.2 Scanning Electron Microscopy SEM 70

2.3 Scanning Tunneling Microscopy and

2.4 Transmission Electron Microscopy TEM 99

Scanning Force Microscopy STM and SFM 85

ELECTRON BEAM INSTRUMENTS

3.0 Introduction 117

3.1 Energy-Dispersive X-Ray Spectroscopy EDS 120

3.2 Electron Energy-Loss Spectroscopy in the

Transmission Electron Microscope EELS 135

3.3 Cathodoluminescence CL 149

3.4 Scanning Transmission Electron Microscopy STEM 161

3.5 Electron Probe X-Ray Microanalysis EPMA 175

V

STRUCTURE DETERMINATION BY DIFFRACTION AND SCATTERING

4.0 Introduction 193

4.1 X-Ray Diffraction XRD 198

4.2 Extended X-Ray Absorption Fine Structure EXAFS 214

4.3 Su&ce Extended X-Ray Absorption Fine Structure and

Near Edge X-Ray Absorption Fine Structure SEXAFS/NEXAFS

Auger Electron Difiction XPD and AED

227

4.4 X-Ray Photoelectron and

4.5 Low-Energy Electron Diffraction LEED 252

4.6 Reflection High-Energy Electron Diffraction WEED 264

240

ELECTRON EMISSION SPECTROSCOPIES

5.0 Introduction 279

5.1 X-Ray Photoelectron Spectroscopy XPS 282

5.2 Ultraviolet Photoelectron Spectroscopy UPS 300

5.3 Auger Electron Spectroscopy AES 310

5.4 Reflected Electron Energy-loss Spectroscopy

REELS 324

X-RAY EMISION TECHNIQUES

6.0 Introduction 335

6.1 X-Ray Fluorescence XRF 338

6.2 Total Reflection X-Ray Fluorescence Analysis TXRF 349

6.3 Particle-Induced X-Ray Emission PIXE 357

VISIBLE/W EMISSION REFLECTION AND ABSORPTION

7.0 Introduction 371

7.1 Photoluminescence PL 373

7.2 Modulation Spectroscopy 385

7.3 Variable Angle Spectroscopic Ellipsometry VASE 401

VIBRATIONAL SPECTROSCOPIES AND NMR

8.0 Introduction 413

8.1 Fourier Transform Infrared Spectroscopy FTIR 416

8.2 RamanSpectroscopy 428

8.3 High-Resolution Electron Energy Loss Spectroscopy HREELS 4-42

8.4 Solid State Nuclear Magnetic Resonance NMR 460

vi Contents

ION SCATTERING TECHNIQUFS

9.0 Introduction 473

9.1 Rutherford Backscattering Spectrometry RBS 476

9.2 Elastic Recoil Spectrometry ERS 488

9.3 Medium-Energy Ion Scattering with

Channeling and Blocking MEIS 502

9.4 Ion scattering Spectroscopy Iss 514

MASS AND OPTICAL SPECTROSCOPIES

Introduction 527

Dynamic Secondary Ion Mass Spectrometry Dynamic SIMS

Static Secondary Ion Mass Spectrometry Static SIMS 549

Surfice Analysis by her Ionization SAL1

Sputtered Neutral Mass Spectrometry SNMS

Laser Ionization Mass Spectrometry LIMS

Spark Source Mass Spectrometry SSMS 598

Glow-Discharge Mass Spectrometry GDMS 609

Inductively Coupled Plasma Mass Spectrometry ICPMS

Inductively Coupled Plasma-Optical

Emission Spectroscopy ICP-OES 633

NEUTRONANDNUCLEARTECHNIQUES

1'1.0 Introduction 645

1 1 .I Neutron Diffraction 648

11.2 Neutron Reflectivity 660

11.3 Neutron Activation Analysis NAA 671

11.4 Nuclear Reaction Analysis NRA 680

PHYSICAL AND MAGNETIC PROPERTIES

12.0 Introduction 695

12.1 Surface Roughness: Measurement Formation by

Sputtering Impact on Depth Profiling 698

12.2 Optical Scatterometry 711

12.3 Magneto-optic Kerr Rotation MOJSE 723

12.4 Physical and Chemical Adsorp

Encyclopedia of Materials Characterization - Surfaces, Interfaces, Thin Films

كيفية التسجيل فى منتدى هندسة الإنتاج والتصميم الميكانيكى

طريقة التنزيل من المنتدى خطوة بخطوة

الهارد الشامل والمتكامل لقسم ميكانيكا

جزاك الله خيراً وبارك الله فيك وجعله فى ميزان حسناتك

كيفية التسجيل فى منتدى هندسة الإنتاج والتصميم الميكانيكى

طريقة التنزيل من المنتدى خطوة بخطوة

الهارد الشامل والمتكامل لقسم ميكانيكا

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كتاب Encyclopedia of Materials Characterization 761752

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